Advantech
Case Studies
Modular AI Defect Inspection Solution for Efficient Semiconductor Equipment Upgrades
Overview
Modular AI Defect Inspection Solution for Efficient Semiconductor Equipment UpgradesAdvantech |
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Drones - Drone Payloads & Accessories Functional Applications - Manufacturing Execution Systems (MES) | |
Equipment & Machinery Semiconductors | |
Maintenance Quality Assurance | |
Infrastructure Inspection Security Claims Evaluation | |
Testing & Certification Training | |
Operational Impact
The implementation of the AI defect inspection solution was highly successful for the semiconductor equipment manufacturer. The solution not only identified defective products but also traced the cause of the defects, thereby assisting the manufacturer in further optimizing the manufacturing process and increasing yields. The manufacturer was so satisfied with the results that they decided to implement AI defect inspection for all their other automated machines. This demonstrated that the combined solution of Advantech and Smasoft was recognized for its valuable contribution by the industry. The solution was not only suitable for semiconductor equipment but also for other manufacturing industries, making the implementation of AI applications much easier. | |
Quantitative Benefit
The AI solution can complete the analysis of 380 images for a single pod within two minutes. | |
The solution can inspect different materials simultaneously. | |
The solution is compact in size and flexible in configuration, fitting into a cabinet in the lower half of the machines. | |