Altair
Case Studies
Characterizing the Murchison Widefield Array Beam Pattern with FEKO
Overview
Characterizing the Murchison Widefield Array Beam Pattern with FEKOAltair |
Analytics & Modeling - Digital Twin / Simulation Networks & Connectivity - RFID | |
Aerospace Chemicals | |
Procurement | |
Traffic Monitoring Virtual Reality | |
Testing & Certification | |
Operational Impact
The use of FEKO in this case study resulted in a more accurate characterization of the MWA's beam pattern compared to previous analytical models. The simulation-based approach allowed for the modeling of the full array geometry, taking into account each of the 16 array elements and the operational frequency of the system. The automation capabilities of FEKO saved a significant amount of time in setting up the different configurations for analysis. The Q-leakage test, which measures the fractional linear polarization, was used to test the validity of the model presented in this study. The results showed vast improvements in accuracy compared to the analytical approach, demonstrating the effectiveness of the approach used in this case study. This work lays the foundation for the EM simulations that will be used for the SKA low telescope. | |
Quantitative Benefit
Huge time savings from automation of configurations | |
Efficient solvers to represent geometry, LNA impedance and soil | |
218 frequency points, 16 array elements, 2 polarizations, nearly 7000 configurations analyzed | |