C3 IoT
Case Studies
Optimizing Semiconductor Manufacturing Yield with IoT
Overview
Optimizing Semiconductor Manufacturing Yield with IoTC3 IoT |
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Analytics & Modeling - Machine Learning Functional Applications - Manufacturing Execution Systems (MES) | |
Equipment & Machinery Semiconductors | |
Product Research & Development Quality Assurance | |
Additive Manufacturing Manufacturing Process Simulation | |
Data Science Services Testing & Certification | |
Operational Impact
The implementation of the C3 AI Process Optimization solution has had a significant impact on the manufacturer's operations. The ability to predict low-yield wafers early in the process and identify process improvements has led to an increase in overall yield. The solution has also enabled the company to identify bad wafers, quantify time and costs saved, and tune design and manufacturing processes to optimize yields. The insights delivered through the C3 AI Process Optimization user interface have been instrumental in driving manufacturing optimization. The solution has also demonstrated the potential of AI in manufacturing, with the company now able to build machine learning algorithms to predict die quality and low-yield wafers. | |
Quantitative Benefit
$39 million estimated annual economic impact | |
Created 3 terabyte unified data image of 830,000 files | |
Created more than 1,500 relevant features | |